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From Niki Haines, Member
AXIe Consortium Marketing Committee

The AXIe standard will reach its 3rd anniversary in June and the interest is growing for this relatively new standard. Interestingly enough this year AXIe’s sibling PXI will be turning 15!

It is encouraging to see that AXIe as a technology standard is gaining a firmer foothold in the market place, especially when looking at applications where more complex test equipment is required and where higher levels of processing are needed along with a larger number of interconnects.

LinkedInOur AXIe Consortium LinkedIn membership numbers continue to increase and we are now a community of 290 members.  

BestInTestMost recently Test and Measurement World awarded its Best in Test Award 2013 in the category of signal analyzers to Agilent for its AXIe based High-Speed Digitizer.

YoutubeIf you want to stay abreast of the AXIe standard you can subscribe to the new AXIe consortium YouTube Channel, or view the latest presentations on the website to see which applications can be addressed with products based on the AXIe standard.

AXIe Consortium members in the technical and marketing committees and the board of directors will be getting together in Loveland, Colorado in March. The members will discuss and define the next steps for the standard, showcase AXIe products and exchange best practices. It will be exciting for everybody to get together and I am eager to see the outcome – so stay tuned and enjoy this issue of the AXIe newsletter. Happy reading!

Niki Haines

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Using an AXIe Digitizer to Achieve High Speed, Multichannel Data Acquisition


In many multichannel high speed data acquisition applications, such as radar, satellite (beam-forming), MIMO, or high-energy experiments, it is critical to have phase coherent channels for accurate data acquisition whether for demodulation, antenna calibration, channel sounding, or event capture. Large-scale experiments may require the use of tens or hundreds of synchronized channels, and very precise time correlation between channels. Therefore, synchronization across multiple instruments is primordial.

This application note describes the measurement and analysis of cross channel skew in multichannel high speed digitizers over short and long durations to sub-picosecond scales. Two measurement techniques using the Agilent High Speed Digitizer which is designed according to the AXIe architecture are described and compared, and the results presented.


AXIe Local Bus Architecture Delivers Unprecedented Bus Speeds

By Larry Desjardin, Modular Methods and Lauri Viitas, Guzik Test and Measurement

AXIe is commonly referred to as the “big brother” of PXI.  This is because it shares many of the features of PXI (open modular structure, PCI Express fabric, similar software) while deploying a large board size, power, and cooling matching that found in high performance instruments.  However, it also adds one very unique aspect: the AXIe local bus.  In this paper the authors describe the local bus, its capabilities, and recently announced products that demonstrate breakthrough system performance utilizing the local bus.  These capabilities include real time streaming and processing in excess of 40GB/s per link.

Real time high-speed streaming enables a number of applications previously unrealized.  Radar system evaluation and simulation is an example, where data is streamed indefinitely from high-speed digitizers into a data processing module or RAID array.  High-energy physics is another example where data is recorded for long periods, to be triggered by an event that is detected by a digital processor unit.  Indeed, there is a broad range of data acquisition applications where long data streams need to be recorded or processed while searching for an intermittent event.  The AXIe local bus enables this capability at previously unattainable speeds.




Thanks to all our readers.
Bob Helsel, Editor





New AXIe Products

The members of the AXIe Consortium continue to release a steady flow of new products based on the emerging AXIe standard, some of which are spotlighted below:

AXIe-1 Base Architecture Specification Products

U4421A Protocol Analyzer and Exerciser for MIPI D-PHY Interfaces

M9703A AXIe 12-bit High-Speed Digitizer

ADC 6000 Series AXIe-based Digitizer Module

DDR Logic Analyzer U4154A

AWG (Arbitrary Waveform Generator) M8190A

AXIe-3.1 Semiconductor Test Extension Products

AX500 - AXIe Benchtop System

High Volume Production Test System



High Speed Pattern Streaming System Based on AXIe’s PCIe
Connectivity and Synchronization Mechanism

By Hank Lin, Product Manager
ADLINK Technology, Inc.

E-Beam (Electron Beam) lithography is a next-generation maskless semiconductor manufacturing process. Being maskless, it eliminates diffraction limitations found in current photolithography for 20nm or smaller processes. E-Beam lithography requires a data streaming system with very high throughput that simultaneously transfers massive amounts of pattern data from a data server, processes the data, while outputting to an E-Beam tool. The E-Beam tool itself interfaces through thousands of fiber optic channels and requires channel-to-channel skew less than 2ns. Based on the challenging density and performance requirements, ADLINK chose the AdvancedTCA Extensions for Instrumentation and Test (AXIe) architecture to implement E-beam streaming. This article describes how the AXIe platform was leveraged to achieve these demanding density and synchronization requirements.



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