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From Bob Helsel,
Editor, AXIe Newsletter

Welcome to the March 2014 issue of the AXIe Newsletter. We have three articles in this issue as well as highlighting some new AXIe products from our members.

LinkedInOur AXIe Consortium LinkedIn membership numbers continue to increase and we are now a community of over 325 members. 

BestInTestTest and Measurement World awarded its Best in Test Award 2013 in the category of signal analyzers to Agilent for its AXIe based High-Speed Digitizer.

YoutubeIf you want to stay abreast of the AXIe standard you can subscribe to the new AXIe consortium YouTube Channel, or view the latest presentation on the website to see which applications can be addressed with products based on the AXIe standard.

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AXIe: it really is big brother to PXI

By Larry Desjardin, Modular Methods

AXIe is the “big brother” of PXI.  It uses the same PCIe (PCI Express) fabric as PXI, but sports higher power and larger board size.  A goal of the AXIe Consortium is to make AXIe appear to controllers and software as a PXI system, but focused on supporting high-end instrumentation.  Like PXI and VXI, it is open to all vendors, and uses similar software drivers, such as IVI and LabView, for instrument control.

So when Agilent contacted me a few days ago about the upcoming announcement, I was interested to see these concepts delivered in what is arguably the highest performance open modular chassis yet created.  Let’s take a look.


High Performance Digitizers for RF Wideband Aerospace/Defense Measurements

By Agilent Technologies and Guzik Test & Measurement


Aerospace/defense applications such as wireless communications, RADAR and Satcom require measurements that are accurate, repeatable and flexible. With high performance digitizers you can directly acquire, down convert and process RF wideband signals for accurate analysis of their characteristics.

Wide bandwidth digitizers capture and process RF signals for subsequent analysis with Vector Signal Analysis (VSA) software. The AXIe digitizers perform digital down conversion (DDC) using built-in digital signal processing (DSP) hardware, implemented in FPGA’s. This eliminates the need for large amounts of data to be transferred to a personal computer for analysis, reducing significantly the overall measurement time.



Thanks to all our readers.
Bob Helsel, Editor





New AXIe Products

The members of the AXIe Consortium continue to release a steady flow of new products based on the emerging AXIe standard, some of which are spotlighted below:

AXIe-1 Base Architecture Specification Products

M9521A AXIe System Module

M9514A AXIe 14-Slot Chassis


IPMI Shelf Manager Card With Redundant IPMB

M9703A AXIe eight-channel wideband digital receiver/digitizer

M8061A Multiplexer 2:1 With De-Emphasis 28 Gb/s

M8192A Multi-Channel Synchronization Module for M8190A

U4431A MIPI M-PHY Protocol Analyzer

U4421A Protocol Analyzer and Exerciser for MIPI D-PHY Interfaces

ADC 6000 Series AXIe-based Digitizer Module

DDR Logic Analyzer U4154A

AWG (Arbitrary Waveform Generator) M8190A

AXIe-3.1 Semiconductor Test Extension Products

AX500 - AXIe Benchtop System

High Volume Production Test System



How to Verify MIPI Conformance
Using an AXIe J-BERT

Submitted by Agilent Technologies

The wide spread and rapid development of cell phones from simple voice-capable devices to smartphones or even tablet PCs with the constant addition of capabilities and features came along with a proliferation of interfaces between ASICs and “sensors” and “terminal devices” such as microphones, cameras, loudspeakers, displays, and peripheral electrical devices which make ASIC development and system integration an increasingly difficult task.

This application note focuses on the requirements for testing ASICs according to the MIPI specification and CTS using the new AXIe J-BERT M8020A,  this highly integrated test setup simplifies the required complex jitter cocktail and test automation enables in-situ calibration making testing an easy task.

The modularity of the AXIe J-BERT provides the flexibility to adapt to test needs and budget. For example, different speed options can be selected, depending on the requirements. The test system can also be configured as single or dual channel modules and additional modules can be added, to address the increased number of lanes that need to be tested. The modules can also be configured as a generator only (omitting the ED), when the DUT does not need to be tested in loopback mode or if it does not support it.




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